Radiation Qualification of Electronics Components used for the ATLAS Level-1 Muon Endcap Trigger System

摘要

The ATLAS end-cap muon level-1 trigger system is divided into three parts; one off-detector part and two on-detector parts. Application specific IC (ASIC) and anti-fuse FPGA (Field Programmable Gate Array) are actively used in on-detector parts. Data transfer with Low-Voltage Data Signaling serial link (LVDS link) is used between two on-detector parts (15m apart) and G-Link (Hewlett-Packard 1.4Gbaud high speed data link) with optical transmission(90m) is used from one of the on-detector parts to the off-detector part. These components will suffer for ten years the radiation of approximately 200Gy of total ionizing dose (TID) and a hadron fluence of 2x10^10 hadrons/c^m2. We have investigated systematically the radiation susceptibility to both total ionizing dose and single event effects for ASIC, FPGA, and Commercial Off The Shelf (COTS) serializer and deserializer chipsets for LVDS (two candidates) and G-Link (one) together. In this presentation we report the result of irradiation tests for these devices and discuss validity of them to use in the system.